A Position Sensitive X-ray Spectrophotometer using Microwave Kinetic Inductance Detectors

Benjamin A. Mazin; Megan E. Eckart; Bruce Bumble; Sunil Golwala; Peter K. Day; Jonas Zmuidzinas; Fiona A. Harrison

doi:10.1063/1.2390664

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A Position Sensitive X-ray Spectrophotometer using Microwave Kinetic Inductance Detectors

Benjamin A. Mazin, Megan E. Eckart, Bruce Bumble, Sunil Golwala, Peter K. Day, Jonas Zmuidzinas, Fiona A. Harrison

arXiv:cond-mat/0610130 · DOI 10.1063/1.2390664 · 2006-10-04 · Applied Physics Letters

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Abstract

The surface impedance of a superconductor changes when energy is absorbed and Cooper pairs are broken to produce single electron (quasiparticle) excitations. This change may be sensitively measured using a thin-film resonant circuit called a microwave kinetic inductance detector (MKID). The practical application of MKIDs for photon detection requires a method of efficiently coupling the photon energy to the MKID. We present results on position sensitive X-ray detectors made by using two aluminum MKIDs on either side of a tantalum photon absorber strip. Diffusion constants, recombination times, and energy resolution are reported. MKIDs can easily be scaled into large arrays.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
Al Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	—	Pressure not reported	—
Ta Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	—	Pressure not reported	—