Probing pairing symmetry of Sm_{1.85}Ce_{0.15}CuO_4 via highly-sensitive voltage measurements: Evidence for strong impurity scattering
A. J. C. Lanfredi, S. Sergeenkov, F. M. Araujo-Moreira
arXiv:cond-mat/0701455 · DOI 10.1016/j.physleta.2006.07.010 · 2007-01-18 · Physics Letters A
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Abstract
Using a highly-sensitive home-made mutual-inductance technique, temperature profiles of the magnetic penetration depth $λ(T)$ in the optimally-doped $Sm_{1.85}Ce_{0.15}CuO_4$ thin films have been extracted. The low-temperature behavior of $λ(T)$ is found to be best-fitted by linear $Δλ(T)/λ(0)= \ln(2)k_BT/Δ_0$ and quadratic $Δλ(T)/λ(0)=Γ^{-1/2}Δ_0^{-3/2}T^2$ laws above and below $T=0.22T_C$, respectively, which clearly indicates the presence of d-wave pairing mechanism dominated by strong paramagnetic scattering at the lowest temperatures. The best fits produce $Δ_0/k_BT_C=2.07$ and $Γ/T_C=0.25(T_C/Δ_0)^3$ for the estimates of the nodal gap parameter and impurity scattering rate.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Sm1.85Ce0.15CuO4 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 20.2 | Pressure not reported | unknown |
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