Thermal expansion of Josephson junctions as an elastic response to an effective stress field
S. Sergeenkov, G. Rotoli, G. Filatrella, F. M. Araujo-Moreira
arXiv:cond-mat/0701459 · DOI 10.1103/PhysRevB.75.014506 · 2007-01-18 · Physical Review B
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Abstract
By introducing a concept of thermal expansion (TE) of a Josephson junction as an elastic response to an effective stress field, we study (both analytically and numerically) the temperature and magnetic field dependence of TE coefficient $α$ in a single small junction and in a square array. In particular, we found that in addition to {\it field} oscillations due to Fraunhofer-like dependence of the critical current, $α$ of a small single junction also exhibits strong flux driven {\it temperature} oscillations near $T_C$. We also numerically simulated stress induced response of a closed loop with finite self-inductance (a prototype of an array) and found that $α$ of a $5\times 5$ array may still exhibit temperature oscillations provided the applied magnetic field is strong enough to compensate for the screening induced effects.
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