Proximity effects and Andreev reflection in mesoscopic SNS junction with perfect NS interfaces
Z. D. Kvon, T. I. Baturina, R. A. Donaton, M. R. Baklanov, K. Maex, E. B. Olshanetsky, A. E. Plotnikov, J. C. Portal
arXiv:cond-mat/9907247 · DOI 10.1103/PhysRevB.61.11340 · 1999-07-18 · Physical Review B
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Abstract
Low temperature transport measurements on superconducting film - normal metal wire - superconducting film (SNS) junctions fabricated on the basis of 6 nm thick superconducting polycrystalline PtSi films are reported. The structures with the normal metal wires of two different lengths L=1.5 $μ$m and L=6$μ$m and the same widths W=0.3$μ$m are studied. Zero bias resistance dip related to pair current proximity effect is observed for all junctions whereas the subharmonic energy gap structure originating from phase coherent multiple Andreev reflections have occurs only in the SNS junctions with short wires.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| PtSi Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 0.54 | Pressure not reported | unknown |
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