Proximity effects and Andreev reflection in a mesoscopic SNS junction with perfect NS interfaces

Z. D. Kvon; T. I. Baturina; R. A. Donaton; M. R. Baklanov; K. Maex; E. B. Olshanetsky; A. E. Plotnikov; J. C. Portal

doi:10.1103/PhysRevB.61.11340

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Proximity effects and Andreev reflection in a mesoscopic SNS junction with perfect NS interfaces

Z. D. Kvon, T. I. Baturina, R. A. Donaton, M. R. Baklanov, K. Maex, E. B. Olshanetsky, A. E. Plotnikov, J. C. Portal

DOI 10.1103/PhysRevB.61.11340 · Physical Review B

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Abstract

Low-temperature transport measurements on superconducting film–normal wire–superconducting film (SNS) junctions fabricated on the basis of thin superconducting polycrystalline PtSi films are reported. Due to the perfectness of SN boundaries in the junctions, zero bias resistance dip related to pair current proximity effect and subharmonic energy gap structure originating from phase coherent multiple Andreev reflections have been observed and studied.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
PtSi Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	0.54	Pressure not reported	unknown