Mesoscopic proximity effect in double-barrier superconductor/normal-metal junctions
D. Quirion, C. Hoffmann, F. Lefloch, M. Sanquer
DOI 10.1103/PhysRevB.65.100508 · Physical Review B
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Abstract
We report transport measurements down to T=60 mK of SININ and SNIN structures in the diffusive limit. We fabricated Al-AlOx/Cu/AlOx/Cu (SININ) and Al/Cu/AlOx/Cu (SNIN) vertical junctions. A zero-bias anomaly was observed in a metallic SININ structure. We attribute this peak of conductance to coherent multireflections of electrons between the two tunnel barriers. This conductance maximum is quantitatively fit by the relevant theory of mesoscopic SININ structures. When the barrier at the SN interface is removed (SNIN structure), we observe a peak of conductance at finite voltage accompanied by an excess of subgap conductance.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Al Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 1.5 | Pressure not reported | unknown |
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