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Temperature-dependent x-ray studies of the high-Tc superconductor La1.9Ba0.1CuO4

E. F. Skelton, W. T. Elam, D. U. Gubser, S. H. Lawrence, M. S. Osofsky, L. E. Toth, S. A. Wolf

DOI 10.1103/PhysRevB.35.7140 · Physical Review B

T1

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Abstract

Simultaneous x-ray diffraction and four-probe electrical resistance measurements have been performed as a function of temperature on a polycrystalline sample of the high-Tc material La1.9Ba0.1CuO4. Comparisons of the diffraction spectra between 290 and 18 K show no evidence of any gross structural distortions. Least-squares refinements of the tetragonal unit-cell parameters at several temperatures indicate smooth monotonic thermal expansions of about 0.10±0.05% along the a axis and about 0.35±0.10% along the c axis over this temperature range.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
La1.9Ba0.1CuO4

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

38Pressure not reportedonset
La1.9Ba0.1CuO4

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

29Pressure not reportedzero_resistance
La1.85Ba0.15CuO4

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

—Pressure not reportedunknown

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