Temperature-dependent x-ray studies of the high-Tc superconductor La1.9Ba0.1CuO4
E. F. Skelton, W. T. Elam, D. U. Gubser, S. H. Lawrence, M. S. Osofsky, L. E. Toth, S. A. Wolf
DOI 10.1103/PhysRevB.35.7140 · Physical Review B
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Abstract
Simultaneous x-ray diffraction and four-probe electrical resistance measurements have been performed as a function of temperature on a polycrystalline sample of the high-Tc material La1.9Ba0.1CuO4. Comparisons of the diffraction spectra between 290 and 18 K show no evidence of any gross structural distortions. Least-squares refinements of the tetragonal unit-cell parameters at several temperatures indicate smooth monotonic thermal expansions of about 0.10±0.05% along the a axis and about 0.35±0.10% along the c axis over this temperature range.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| La1.9Ba0.1CuO4 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 38 | Pressure not reported | onset |
| La1.9Ba0.1CuO4 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 29 | Pressure not reported | zero_resistance |
| La1.85Ba0.15CuO4 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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