Possibility of the vortex-antivortex transition temperature of a thin-film superconductor being renormalized by disorder
A. F. Hebard, G. Kotliar
DOI 10.1103/PhysRevB.39.4105 · Physical Review B
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Abstract
The universal relation between the Kosterlitz-Thouless transition temperature Tc and the superfluid sheet density of thin-film superconductors with mean-field transition temperature Tc0 results in a monotonically decreasing dependence of the ratio Tc/Tc0 on the normal-state sheet resistance Rn. Ambiguity in the experimental definition of Rn in highly disordered thin-film superconductors is addressed by reexamining previously published data on amorphous composite In/InOx films. Arguments are presented in favor of using the zero-temperature value of Rn, a quantity obtained by extrapolation. The dependence of Tc/Tc0 on Rn that results from such a choice is in agreement with theory for dirty superconductors and thus suggests that additional corrections to Tc in the presence of extreme disorder are not required.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| In/InOx Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
| HgXe Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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