Superconductivity in ion-beam-mixed layered Au-Si thin films
N. M. Jisrawi, W. L. McLean, N. G. Stoffel, M. S. Hegde, C. C. Chang, D. L. Hart, D. M. Hwang, T. S. Ravi, B. J. Wilkens, J. Z. Sun, T. H. Geballe
DOI 10.1103/PhysRevB.43.7749 · Physical Review B
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Abstract
The superconducting properties of thin films made by mixing alternating layers of Au and Si using ion-beam bombardment correlate with the formation of metastable metallic phases in what is otherwise a simple eutectic system. Transmission-electron-microscopy measurements reveal the superconducting phases to be amorphous. Compound formation and the nature of Au-Si bonding in these metastable phases are demonstrated from x-ray photoelectron spectroscopy and from a previous study of x-ray-absorption spectroscopy. After mixing with a beam of Xe ions, multilayered films with an average nominal composition AuxSi1−x, where x=0.2, 0.4, 0.5, 0.72, and 0.8, exhibited superconducting transition temperatures in the range 0.2–1.2 K. A double transition feature in the magnetic field dependence of the resistivity is attributed to the formation of more than one metastable metallic phase in the same sample as the ion dose increases.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| AuxSi1-x Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 1.2 | Pressure not reported | onset |
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