Generalized inversion scheme for the determination of activation energies from flux-creep experiments in high-Tc superconductors
H. G. Schnack, R. Griessen, J. G. Lensink, Wen Hai-Hu
DOI 10.1103/PhysRevB.48.13178 · Physical Review B
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Abstract
For thermally activated flux creep, which can be characterized by a temperature-magnetic-field-, and current-density-dependent activation energy U(j,T;Be), we show that this function can be determined from a combination of magnetization and magnetization dynamical relaxation rate data. As an illustration the method is applied to creep data on epitaxial YBa2Cu3O7 thin films. In contrast to previously proposed procedures, the present inversion scheme is much more general as it does not require a priori assumptions about the explicit temperature or field dependence of U.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| YBa2Cu3O7 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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