Reentrant superconductivity mechanisms in amorphous carbon-silicon films containing tungsten
S. M. Chudinov, R. Ferretti, S. Fusari, G. Mancini, S. Stizza
DOI 10.1103/PhysRevB.62.12516 · Physical Review B
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Abstract
A model—based on Josephson junctions array and Coulomb blockage—is presented that is capable to explain reentrant resistive peaks in diamondlike carbon-silicon films containing tungsten. Such systems show a main transition together with one or two reentrant or quasireentrant ones: computer simulations for one reentrant resistive peak have been performed that confirm with clear evidence the experimental data.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| W2C Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
| WxC1-x Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
| W0.6Si0.4 Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 2.8 | Pressure not reported | unknown |
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