Efficiency of quasiparticle evacuation in superconducting devices
Sukumar Rajauria, L. M. A. Pascal, Ph. Gandit, F. W. J. Hekking, B. Pannetier, H. Courtois
DOI 10.1103/PhysRevB.85.020505 · Physical Review B
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Abstract
The diffusion of excess quasiparticles in a current-biased superconductor strip in proximity to a metallic trap junction is studied. In particular, we have measured accurately the superconductor temperature at a near-gap injection voltage. By analyzing our data quantitatively, we provide a full description of the spatial distribution of excess quasiparticles in the superconductor. We show that a metallic trap junction contributes significantly to the evacuation of excess quasiparticles.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Al Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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