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First-Order Reorientation of the Flux-Line Lattice in CaAlSi

P. K. Biswas, M. R. Lees, G. Balakrishnan, D. Q. Liao, D. S. Keeble, J. L. Gavilano, N. Egetenmeyer, C. D. Dewhurst, D. McK. Paul

arXiv:1201.0174 · DOI 10.1103/PhysRevLett.108.077001 · 2011-12-30 · Physical review letters

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Abstract

The flux line lattice in CaAlSi has been studied by small angle neutron scattering. A well defined hexagonal flux line lattice is seen just above Hc1 in an applied field of only 54 Oe. A 30 degree reorientation of this vortex lattice has been observed in a very low field of 200 Oe. This reorientation transition appears to be of first-order and could be explained by non-local effects. The magnetic field dependence of the form factor is well described by a single penetration depth of 1496(1) angstroms and a single coherence length of 307(1) angstroms at 2 K. At 1.5 K the penetration depth anisotropy is 2.7(1) with the field applied perpendicular to the c axis and agrees with the coherence length anisotropy determined from critical field measurements.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
CaAlSi

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6.75Pressure not reportedunknown
CaAlSi

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—Pressure not reportedunknown
CaAlSi

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—Pressure not reportedunknown
MgB2

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—Pressure not reportedunknown

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