Photon-noise limited sensitivity in titanium nitride kinetic inductance detectors

Johannes Hubmayr; Jim Beall; Dan Becker; Hsaio-Mei Cho; Mark Devlin; Bradley Dober; Chris Groppi; Gene C. Hilton; Kent D. Irwin; Dale Li; Phillip Mauskopf; Dave P. Pappas; Jeff Van Lanen; Michael R. Vissers; Yiwen Wang; Lian-Fu Wei; Jiansong Gao

doi:10.1063/1.4913418

Photon-noise limited sensitivity in titanium nitride kinetic inductance detectors

Johannes Hubmayr, Jim Beall, Dan Becker, Hsaio-Mei Cho, Mark Devlin, Bradley Dober, Chris Groppi, Gene C. Hilton, Kent D. Irwin, Dale Li, Phillip Mauskopf, Dave P. Pappas, Jeff Van Lanen, Michael R. Vissers, Yiwen Wang, Lian-Fu Wei, Jiansong Gao

arXiv:1406.4010 · DOI 10.1063/1.4913418 · 2014-06-16 · Applied Physics Letters

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Abstract

We demonstrate photon-noise limited performance at sub-millimeter wavelengths in feedhorn-coupled, microwave kinetic inductance detectors (MKIDs) made of a TiN/Ti/TiN trilayer superconducting film, tuned to have a transition temperature of 1.4~K. Micro-machining of the silicon-on-insulator wafer backside creates a quarter-wavelength backshort optimized for efficient coupling at 250~\micron. Using frequency read out and when viewing a variable temperature blackbody source, we measure device noise consistent with photon noise when the incident optical power is $>$~0.5~pW, corresponding to noise equivalent powers $>$~3$\times 10^{-17}$ W/$\sqrt{\mathrm{Hz}}$. This sensitivity makes these devices suitable for broadband photometric applications at these wavelengths.

Source-reported materials — not catalogue approval

Formula	Reported Tc (K)	Pressure (GPa)	Type
TiN Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.	1.4	Pressure not reported	unknown