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Superconducting properties of very high quality NbN thin films grown by high temperature chemical vapor deposition

D. Hazra, N. Tsavdaris, S. Jebari, A. Grimm, F. Blanchet, F. Mercier, E. Blanquet, C. Chapelier, M. Hofheinz

arXiv:1603.09635 · DOI 10.1088/0953-2048/29/10/105011 · 2016-03-31 · Superconductor Science and Technology

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Abstract

Niobium nitride (NbN) is widely used in high-frequency superconducting electronics circuits because it has one of the highest superconducting transition temperatures ($T_c$ $\sim$ 16.5 K) and largest gap among conventional superconductors. In its thin-film form, the $T_c$ of NbN is very sensitive to growth conditions and it still remains a challenge to grow NbN thin film (below 50 nm) with high $T_c$. Here, we report on the superconducting properties of NbN thin films grown by high-temperature chemical vapor deposition (HTCVD). Transport measurements reveal significantly lower disorder than previously reported, characterized by a Ioffe-Regel ($k_F$$\ell$) parameter of $\sim$ 14. Accordingly we observe $T_c$ $\sim$ 17.06 K (point of 50% of normal state resistance), the highest value reported so far for films of thickness below 50 nm, indicating that HTCVD could be particularly useful for growing high quality NbN thin films.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
NbN

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16.5Pressure not reportedunknown
NbN

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17.06Pressure not reportedmidpoint
NbN

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Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

16.8Pressure not reportedmidpoint
NbN

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17.02Pressure not reportedmidpoint
NbN

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17.06Pressure not reportedmidpoint

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