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Fabrication of grain boundary junctions using NdFeAs(O,F) superconducting thin films

Taito Omura, Takuya Matsumoto, Takafumi Hatano, Kazumasa Iida, Hiroshi Ikuta

arXiv:1712.05966 · DOI 10.1088/1742-6596/1054/1/012024 · 2017-12-16 · Journal of Physics: Conference Series

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Abstract

We report on the growth of NdFeAs(O,F) thin films on [001]-tilt MgO bicrystal substrates with misorientation angle theta_GB=6°, 12°, 24° and 45°, and their inter- and intra-grain transport properties. X-ray diffraction study confirmed that all our NdFeAs(O,F) films are epitaxially grown on the MgO bicrystals. The theta_GB dependence of the inter-grain critical current density Jc shows that, unlike Co-doped BaFe2As2 and Fe(Se,Te), its decay with theta_GB is rather significant. As a possible reason of this result, fluorine may have diffused preferentially to the grain boundary region and eroded the crystal structure.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
NdFeAs(O,F)

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47Pressure not reportedonset
NdFeAs(O,F)

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46Pressure not reportedzero_resistance
NdFeAs(O,F)

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43Pressure not reportedunknown
LnFePn(O,F)

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58Pressure not reportedunknown

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