Ultra-broadband near-field Josephson microwave microscopy

Ping Zhang; Yang-Yang Lyu; Jingjing Lv; Zihan Wei; Shixian Chen; Chenguang Wang; Hongmei Du; Dingding Li; Zixi Wang; Shoucheng Hou; Runfeng Su; Hancong Sun; Yuan Du; Li Du; Liming Gao; Yong-Lei Wang; Huabing Wang; Peiheng Wu

Ultra-broadband near-field Josephson microwave microscopy

Ping Zhang, Yang-Yang Lyu, Jingjing Lv, Zihan Wei, Shixian Chen, Chenguang Wang, Hongmei Du, Dingding Li, Zixi Wang, Shoucheng Hou, Runfeng Su, Hancong Sun, Yuan Du, Li Du, Liming Gao, Yong-Lei Wang, Huabing Wang, Peiheng Wu

arXiv:2401.12545 · 2024-01-23

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Abstract

Advanced microwave technologies constitute the foundation of a wide range of modern sciences, including quantum computing, microwave photonics, spintronics, etc. To facilitate the design of chip-based microwave devices, there is an increasing demand for state-of-the-art microscopic techniques capable of characterizing the near-field microwave distribution and performance. In this work, we integrate Josephson junctions onto a nano-sized quartz tip, forming a highly sensitive microwave mixer on-tip. This allows us to conduct spectroscopic imaging of near-field microwave distributions with high spatial resolution. Leveraging its microwave-sensitive characteristics, our Josephson microscope achieves a broad detecting bandwidth of up to 200 GHz with remarkable frequency and intensity sensitivities. Our work emphasizes the benefits of utilizing the Josephson microscope as a real-time, non-destructive technique to advance integrated microwave electronics.