Study of delamination in REBCO coated conductor by transmission electron microscopy
Yan Xin, Jun Lu, Ke Han
arXiv:2410.11556 · DOI 10.1109/TASC.2024.3512520 · 2024-10-15 · IEEE Transactions on Applied Superconductivity
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Abstract
Delamination strength of REBCO is very important for its applications in large magnet projects. This work presented the transmission electron microscopy (TEM) investigation of the microstructures of the REBCO coated conductor to understand its delamination property. We found that the low delamination strength is associated with nano-voids formed at the IBAD MgO/Y2O3 interface.
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