Advanced SQUID-on-lever scanning probe for high-sensitivity magnetic microscopy with sub-100-nm spatial resolution

Abstract

Superconducting quantum interference devices (SQUIDs) are exceptionally sensitive magnetometers capable of detecting weak magnetic fields. Miniaturizing these devices and integrating them onto scanning probes enables high-resolution imaging at low-temperature. Here, we fabricate nanometer-scale niobium SQUIDs with inner-loop sizes down to 10 nm at the apex of individual planar silicon cantilevers via a combination of wafer-scale optical lithography and focused-ion-beam (FIB) milling. These robust SQUID-on-lever probes overcome many of the limitations of existing devices, achieving spatial resolution better than 100 nm, magnetic flux sensitivity of $0.3~μΦ_0/\sqrt{\rm{Hz}}$, and operation in magnetic fields up to about 0.5 T at 4.2 K. Nanopatterning via Ne- or He-FIB allows for the incorporation of a modulation line for coupling magnetic flux into the SQUID or a third Josephson junction for shifting its phase. Such advanced functionality, combined with high spatial resolution, large magnetic field range, and the ease of use of a cantilever-based scanning probe, extends the applicability of scanning SQUID microscopy to a wide range of magnetic, normal conducting, superconducting, and quantum Hall systems. We demonstrate magnetic imaging of skyrmions at the surface of bulk Cu$_2$OSeO$_3$. Analysis of the point spread function determined from imaging a single skyrmion yields a full-width-half-maximum of 87 nm. Moreover, we image modulated magnetization patterns with a period of 65 nm.

Source-reported materials — not catalogue approval

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