← Back to search

Hole Doping Dependence of the Coherence Length in $La_{2-x}Sr_xCuO_4$ Thin Films

H. H. Wen, H. P. Yang, S. L. Li, X. H. Zeng, A. A. Soukiassian, W. D. Si, X. X. Xi

arXiv:cond-mat/0305244 · DOI 10.1209/epl/i2003-00627-1 · 2003-05-12 · EPL

T1theoretical44 citations

Active bibliographic source — not scientific approval

Bibliographic access preserves source history; it does not approve extracted materials or validate reported claims. Review warnings on each occurrence separately.

Abstract

By measuring the field and temperature dependence of magnetization on systematically doped $La_{2-x}Sr_xCuO_4$ thin films, the critical current density $j_c(0)$ and the collective pinning energy $U_p(0)$ are determined in single vortex creep regime. Together with the published data of superfluid density, condensation energy and anisotropy, for the first time we derive the doping dependence of the coherence length or vortex core size in wide doping regime directly from the low temperature data. It is found that the coherence length drops in the underdoped region and increases in the overdoped side with the increase of hole concentration. The result in underdoped region clearly deviates from what expected by the pre-formed pairing model if one simply associates the pseudogap with the upper-critical field.

Source-reported materials — not catalogue approval

FormulaReported Tc (K)Pressure (GPa)Type
La2-xSrxCuO4

Archive — visibility unverified

Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula.

38Pressure not reportedunknown

Similar papers