Collapse of thermal activation in moderately damped Josephson junctions
V. M. Krasnov, T. Bauch, S. Intiso, E. Hürfeld, T. Akazaki, H. Takayanagi, P. Delsing
arXiv:cond-mat/0503067 · DOI 10.1103/PhysRevLett.95.157002 · 2005-03-03
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Abstract
We study switching current statistics in different moderately damped Josephson junctions: a paradoxical collapse of the thermal activation with increasing temperature is reported and explained by interplay of two conflicting consequences of thermal fluctuations, which can both assist in premature escape and help in retrapping back into the stationary state. We analyze the influence of dissipation on the thermal escape by tuning the damping parameter with a gate voltage, magnetic field, temperature and an in-situ capacitor.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Bi2Sr2CaCu2O8+δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 93 | Pressure not reported | unknown |
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | — |
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