Quantum size effects on the perpendicular upper critical field in ultra-thin lead films
Xin-Yu Bao, Yan-Feng Zhang, Yupeng Wang, Jin-Feng Jia, Qi-Kun Xue, X. C. Xie, Zhong-Xian Zhao
arXiv:cond-mat/0507172 · DOI 10.1103/PhysRevLett.95.247005 · 2005-07-07 · Physical review letters
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Abstract
We report the thickness-dependent (in terms of atomic layers) oscillation behavior of the perpendicular upper critical field $H_{c2\perp}$ in the ultra-thin lead films at the reduced temperature ($t=T/T_c$). Distinct oscillations of the normal-state resistivity as a function of film thickness have also been observed. Compared with the $T_c$ oscillation, the $H_{c2\perp}$ shows a considerable large oscillation amplitude and a $π$ phase shift. The oscillatory mean free path caused by quantum size effect plays a role in $H_{c2\perp}$ oscillation.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Pb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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