Combined scanning force microscopy and scanning tunneling spectroscopy of an electronic nano-circuit at very low temperature
Julien Senzier, Pengshun S. Luo, Hervé Courtois
arXiv:cond-mat/0610408 · DOI 10.1063/1.2436651 · 2006-10-16 · Applied Physics Letters
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Abstract
We demonstrate the combination of scanning force microscopy and scanning tunneling spectroscopy in a local probe microscope operating at very low temperature (60 mK). This local probe uses a quartz tuning fork ensuring high tunnel junction stability. We performed the spatially-resolved spectroscopic study of a superconducting nano-circuit patterned on an insulating substrate. Significant deviations from the BCS prediction are observed.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Nb Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | 7.4 | Pressure not reported | unknown |
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