Magnetoresistance properties of Bi2Sr2−xLaxCuO6+δ superconducting thin films grown on vicinal substrates
Y. Z. Zhang, R. Deltour, J.-F. de Marneffe, Y. L. Qin, L. Li, Z. X. Zhao, A. G. M. Jansen, P. Wyder
DOI 10.1103/PhysRevB.61.8675 · Physical Review B
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Abstract
The magnetoresistance properties, in magnetic fields up to 23.5 T, have been studied for superconducting thin films of Bi-2201 grown on vicinal substrates. The high resistivity anisotropy ρy/ρx, together with the only small differences in the corresponding activation energies are attributed to the vicinal structure, the same pinning sites for the flux flow in the ab planes and differences due to step edge pinning. The Hc2(T) data which could be fitted by numerical analysis to an exponential temperature dependence lead to the conclusion that the upward curvature of Hc2(T) does not imply a divergent Hc2(T=0) value.
Source-reported materials — not catalogue approval
| Formula | Reported Tc (K) | Pressure (GPa) | Type |
|---|---|---|---|
| Bi2Sr2-xLaxCuO6+δ Archive — visibility unverified Source-occurrence policy only; no material identity or catalogue acceptance is inferred from the formula. | — | Pressure not reported | unknown |
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