Scanned SQUID Microscope with High-speed Electrical Connectivity

Ian W. Haygood; Bochao Xu; John Biesecker; Michael L. Schneider

doi:10.1063/5.0301774

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Scanned SQUID Microscope with High-speed Electrical Connectivity

Ian W. Haygood, Bochao Xu, John Biesecker, Michael L. Schneider

arXiv:2509.07137 · DOI 10.1063/5.0301774 · 2025-09-08 · The Review of scientific instruments

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Abstract

We report on a scanned superconducting quantum interference device (SQUID) microscope operating in a cryogen-free cryostat, with the capability of up to forty RF connections with 20 GHz bandwidth to a device under test. The system utilizes planar gradiometric DC SQUIDs, which are fully shielded except for a pair of pickup coils with radii as small as 250 nm and have on chip field coils allowing for susceptometry. The system noise is 1.3 $μΦ_{0}/\sqrt{Hz}$ at the base temperature of 3.3 K. The sample temperature is variable and both magnetometry and susceptibility measurements are simultaneously possible with the sample temperature above 40 K. Through the use of a cryogenic chip socket and silicon interposer round trip RF losses to a sample are approximately 15 dB at 20 GHz. A combination of both active and passive magnetic shielding result in a residual magnetic field less than 100 nT at the sample location.