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Off-axis MgB2 films using an in situ annealing pulsed laser deposition method

Yue Zhao, Mihail Ionescu, Josip Horvat, Shi Xue Dou

arXiv:cond-mat/0503730 · DOI 10.1088/0953-2048/18/4/004 · 2005-03-31 · Superconductor Science and Technology

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Abstract

Highly smooth and c-axis oriented superconducting MgB2 thin films were prepared by pulsed laser deposition (PLD) with off-axis geometry. The films were deposited on Al2O3-C substrates perpendicularly aligned to a stoichiometric MgB2 target in a 120 mTorr high purity Ar background gas. An in situ annealing was carried out at 650C for 1 min in a 760 Torr Ar atmosphere. Despite the short annealing time, an x-ray theta-2 theta scan shows fairly good crystallization, according to the clear c-axis oriented peaks for the films. Both atomic force microscopy and the x-ray diffraction results indicate that the crystallite size is less than 50nm. The root mean square roughness of our off-axis film is ~4 nm in a 5x5 square micron area. The Tc onset value of the best off-axis film reaches 33.1 K with a narrow transition width of 0.9 K. The films showed no anisotropy in Hc2-T curves when parallel and perpendicular fields were applied. The slope of Hc2-T curves in low field regime is 1 T/K, which is among the highest reported values.

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FormulaReported Tc (K)Pressure (GPa)Type
MgB2

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33.1Pressure not reportedonset

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